"A versatile UHV-polarimeter for the EUV XUV spectral range is described which incorporates two optical elements: a phase retarder and a reflection analyzer. Both optics are azimuthally rotatable around the incident synchrotron radiation beam and the incidence angle is freely selectable. This allows for a variety of reflectometry, polarimetry and ellipsometry applications on magnetic or non-magnetic samples and multilayer optical elements." http://dx.doi.org/10.17815/jlsrf-2-90
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