Nanospectroscopy @ Elettra
The study of nanostructured materials requires analytical methods that combine X-ray spectroscopy with electron microscopy. The Nanospectroscopy beamline at Elettra operates a state-of-the-art spectroscopic photoemission and low energy electron microscope (SPELEEM) which provides the users with a wide range of complementary methods providing structural, chemical and magnetic sensitivity. This powerful instrument reaches a lateral resolution of few tens nanometers. The microscope is served by a high photon flux beamline, which can deliver elliptically polarized photons in the range 50 eV to 1000 eV. Research applications typically address the characterization of surfaces, interfaces, thin films, micro and nanostructures in fields closely related to materials and surface sciences.