Imaging XPEEM spectroscopy, microprobe ARPES and XPS

The analysis of chemical and electronic states in complex and nanostructured material systems requires electron spectroscopyto be carried out with nanometer lateral resolution, i.e. spectronanoscopy. This goal is achieved in NanoESCA instrumentby combining a parallelimaging photoelectron emission microscope with an appropriate energy filter.This instrument has a particular emphasis on the spectroscopic aspectsand enables laterally resolved photoelectron spectroscopy from the VUV up into the hard x-ray regime.

The design includes a non-magnetic, electrostatic PEEM lens and a double-pass hemispherical analyser. Rapid PEEM survey imaging(< 50 nm resolution) can be used to locate features, whilst its lateral resolution in imaging ESCA of 650 nm in the laboratory and 150 nm at the Synchrotron are simply unique.