BL 02.2 R - SuperESCA

Fast XPS @ Elettra

High resolution core-level photoemission spectroscopy (HR-XPS) allows in depth investigations on the electronic and structural properties of a variety of samples that ranges between single crystals, thin films as well as new nanostructured materials.
SuperESCA (the first beamline operating at Elettra since 1994) brings the possibilities of this technique even further: by combining high resolution capabilities with the high flux of linearly polarised photons in the 90 to 1500 eV range, in the beamline end-station it is possible to obtain high resolution spectra also for low-density systems (such as thin films or supported nanoparticles) and follow in real-time their evolution, e.g. during functionalization processes or surface reactions.

Beamline Energy Resolution
40 [meV] @ 400 [eV]
180 [meV] @ 900 [eV]
Beamline Resolving Power
1 * 104 [deltaE/E] @ 400 [eV]
5 * 103 [deltaE/E] @ 900 [eV]
Beamline Energy Range
90 - 1800 [eV]
Max Flux On Sample
1 * 1013 [ph/s] @ 200 [eV]
1 * 1012 [ph/s] @ 400 [eV]
Spot Size On Sample Hor
100 - 150 [um]
Spot Size On Sample Vert
5 - 100 [um]
Angle Of Incidence Light On Sample Value
20 - 90 [degrees]
Photon Sources

2 section Kyma Linear Planar Undulator

Available Polarization
Linear horizontal
Source Spectral Brightness
1 * 1019 [ph/s/mrad^2/mm^2] @ 200 [eV]
Energy Range
95 - 1800 [eV]
Number Of Periods
46 [mm]


Energy Range
85 - 1800 [eV]
Plane Grating Mirror (PGM)
Resolving Power
5 * 103 [E/deltaE] @ 900 [eV]
1 * 104 [E/deltaE] @ 400 [eV]
Number Of Gratings
Grating Type
laminar grating - 1220 lines/mm
blaze grating - 1220 lines/mm
Pre-focusing Mirror Type
Refocusing Mirror Type
Endstations or Setup

SuperESCA Main

Hemispherical Electron Energy Analyzer SPECS Phoibos 150:
- mean radius 150 mm
- energy resolution < 5 meV
- acceptance angle up to ±13°
- home made 1D delay line detector
Base Pressure
8 * 10-11 [mbar]
Detectors Available
1D Delay Line Detector
Endstation Operative


Sample Type
Crystal, Amorphous
Other Sample Type
Nanostructured samples
Mounting Type
Custom mounting plate or modified CTPO sample holder
Required Sample Size
X = 9 [mm], Y = 9 [mm], Z = 1 [mm]

Techniques usage

Absorption / NEXAFS
Absorption spectra are measured in Auger yield.
By changing sample orientation, the angle between the electric field E of the polarized light and and the normal to the sample surface can be varied in the range from 20 to 90 degrees.
Photoelectron emission / Angular Resolved PES
The technique is available if the modified CTPO manipulator is used, which allows software controlled angular movements of the samples.
Photoelectron emission / Photoelectron diffraction
Core level intensity is measured as a function of polar and azimuthal emission angles. The technique is available if the modified CTPO manipulator is used, which allows software controlled angular movements of the samples.
Photoelectron emission / Time-resolved studies
Fast XPS allows monitoring the evolution of core level spectra (typical acquisition time between 4 and 10 seconds per spectrum), e.g. while exposing the sample to gases or during an annealing.

Manipulator or Sample stage

Degrees Of Freedom
Positioning Precision
X = 20 [um], Y = 20 [um], Z = 500 [um]
Range Of Movement
X = 25 [mm], Y = 25 [mm], Z = 500 [mm]

Sample Holders

The custom sample plate is designed for mounting samples on the LHe cyrostat.
The LHe cryostat, combine with radiative or electron bombardment heating, allows stabilizing the sample temperature in the range between 15 K (80 K if liquid nitrogen is used) and 1500 K .
Only polar angle rotations are allowed.
Sample transfer is not possible.
Sample holder for the modified CTPO manipulator devoted to angular resolved measurements.
The sample holder allows radiative sample heating between 300 and 1100 K.
Polar and azimuthal rotations are possible.
The systems allows sample exchange by means of a fast entry lock.

1D Delay Line Detector

Microchannel Plate based delay line detector.
In house developed 1 dimensional delay line detector.
The detector is mounted on the SPECS Phoibos 150 electron spectrometer.
Pixel Size
X = 100 [um]
Array Size
X = 800 [pixel]
Passive or Active (Electronics)
Output Readout Software
LabView based home developed software


Detected Particle
Silvano LIZZIT
Photoelectron emission
  • Angular Resolved PES
  • Photoelectron diffraction
  • Time-resolved studies
  • XPS
  • Other - Chemistry
Material Sciences
  • Knowledge based multifunctional materials
  • Other - Material Sciences
Elettra - Sincrorone Trieste S.C.p.A.
Strada Statale 14, km 163.5, in Area Science Park
34149 Basovizza, Trieste ITALY
control/Data analysis
Control Software Type
  • LabView based software.
Data Output Type
  • Spectra File and Parameter File with Analyzer Settings, Temperature, Pressure, Photon Energy, Reference Current, Sample Polar and Azimuthal Angles, Custom Readings on request.
Data Output Format
  • Igor format, ASCII format if requested by the user.
Softwares For Data Analysis
  • Commercial Igor software.
Equipment That Can Be Brought By The User
evaporators, Knudsen cells