PHELIX is a beamline using soft X-rays, the source of which is an APPLE II undulator with permanent magnets.

This type of insertion device gives the opportunity to obtain a variable polarization of light: linear polarization at any angle as well as circular and elliptical polarization.

The PHELIX end-station enables a wide range of spectroscopic and absorption studies characterized by different surface sensitivity. Besides collecting standard high-resolution spectra, it allows, e.g. to map the band structure in three dimensions and to detect the spin in three dimensions.

The main components of the PHELIX end-station are as follows:

well-equipped analysis chamber with hemispherical photoelectron energy analyzer with resolution ~1 meV, 3D spin detector VLEED-type, total fluorescence detector and additional sources of radiation (X, UV) enabling operation without a beam,
preparation chamber with effusion cells and EBVs for in situ thin layers deposition with precise control of their thickness, LEED diffractometer, leak valves enabling operation with various gases and a sample stage allowing samples to be heated up to 2000°C,
crystal cleaver chamber allowing to expose atomically smooth surfaces under ultra-high vacuum conditions.
Application:

• new materials for spintronics and magnetoelectronics, topological insulators
• thin films and multilayers systems including samples obtained in-situ
• surface of bulk compounds
• surface magnetism, spin polarized surface states
• chemical reactions taking place on the surface
• biomaterials.