DEMETER beamline is specialized research installation using variable polarization radiation, the source of which is the EPU undulator (elliptically polarizing undulator).

The concept of the beamline DEMETER (Dual Microscopy and Electron Spectroscopy Beamline) assumes the coexistence of two measurement branches, in which the research end-stations will be the PEEM microscope (photoemission electron microscope) and STXM (scanning transmission X-ray microscope). The PEEM branch will also contain an octupol station.

The octupole research station will be dedicated to measurements of magnetic circular dichroism in the absorption of X-rays.

The PEEM end-station with standard equipment will allow for the creation and modification of research systems and imaging of their surfaces in a wide range of temperatures and with high resolution. The main advantage of the method is the ability to select the energy of excitations and the possibility of tuning to the characteristic edge of the absorption.

The parent institution for the PEEM end station is the Jerzy Haber Institute of Catalysis and Surface Chemistry of the Polish Academy of Sciences (ICSC PAS). Thanks to the collaboration of SOLARIS with the Jerzy Haber Institute of Catalysis and Surface Chemistry of the Polish Academy of Sciences and the AGH University of Science and Technology in Kraków (AGH-UST) on March 2, 2016, an appropriate agreement was signed (event information) under which the PEEM end station is made available to Users in the synchrotron facility. As part of the cooperation, the infrastructure for the end station is maintained and developed, and the support of the microscope operators during the measurements is provided.

 The STXM end-station will provide chemical analysis at the nanoscale through the combination of X-ray absorption spectrometry and microscopy.

Potential application of the beamline:

Magnetic order research
Domain structure research
Imaging of the chemical composition
Biomolecular spectroscopy
Fluorescence detection.

Beamline Energy Resolution
8 * 10-2 [meV] @ 400 [eV]
Beamline Resolving Power
8 * 103 [deltaE/E] @ 400 [eV]
Beamline Energy Range
150 - 2000 [eV]
Max Flux On Sample
2 * 1011 [ph/s] @ 400 [eV]
Spot Size On Sample Hor
0.015 - 0.1 [mm]
0.02 - 0.1 [mm]
Spot Size On Sample Vert
0.01 - 0.05 [mm]
0.01 - 0.05 [mm]
Angle Of Incidence Light On Sample Value
16 - 90 [degrees]
Anna Mandziak
Krzysztof Matlak
  • XMCD
  • Crystallography
  • Surface diffraction
  • Topography
Emission or Reflection
  • X-ray fluorescence (XRF)
  • Fluorescence imaging
  • Medical application
  • Photoemission EM
  • Ptychography
  • Scanning photoemission EM
  • X-ray microscopy
  • X-ray tomography
Photoelectron emission
  • Angular Resolved PES
  • Photoelectron diffraction
  • XPS
  • Biochemistry
  • Catalysis
  • Electrochemistry
  • Green Chemistry
  • Physical Chemistry
Earth Sciences & Environment
  • Mineralogy
  • Technique Development - Earth Sciences & Environment
  • Sustainable energy systems
Engineering & Technology
  • Nanotechnology & production processes
Life Sciences & Biotech
  • Biophysics
  • Molecular and cellular biology
  • Other - Life Sciences & Biotech
  • Pharmaceutics (drug screening)
  • Protein and macromolecular structures
  • Technique Development - Life Sciences & Biotech
Material Sciences
  • Knowledge based multifunctional materials
  • Metallurgy
  • Other - Material Sciences
  • Technique Development - Material Sciences
  • Atomic & molecular physics
  • Dynamics
  • Matter under extreme conditions, warm dense matter, plasmas
  • Nanophysics & physics of confined matter
  • Quantum electronics & optics
  • Soft condensed matter physics
  • Surfaces, interfaces and thin films
  • Technique Development - Physics
Czerwone Maki 98
30-392 Krakow, Poland
control/Data analysis
Control Software Type
  • PEEM - LEEE 2000/ UView
    STXM - custom made STXM software / TANGO
Data Output Type
  • PEEM & STXM - binary
Data Output Format
  • PEEM - dat. ; tiff. ; png. ;
    STXM - dat.; txt. ;
Softwares For Data Analysis
  • PEEM - Fiji; Image; Igor J; LEEM Analisis
    STXM - Axis 2000; Matlab
Equipment That Can Be Brought By The User
evaporators, crackers, electronics, sample holders, gas cells