Surfaces / Interfaces: MicroscopyThe SIM beamline produces a high flux of soft X-rays with variable polarization from an undulator source. The beamline has a Photo-Emission Electron Microscope (PEEM) (Model: LEEM III, Elmitec GmbH) as a permanent endstation open to user via the SLS proposals system. The instrument allows to image samples using the photoelectric effect with very high spatial resolution (100 nm), chemical and magnetic sensitivity. With an energy analyzer the excited photoelectrons can be energy-selected. In addition to illumination by X-rays, illumination by low energy electrons is possible. In this low energy electron microscopy (LEEM) mode additional contrast mechanisms are available.